Elias,J.; Gizowska,M.; Brodard,P.; Widmer,R.; deHazan,Y.; Graule,T.; Michler,J. ; Philippe,L.
Electrodeposition of gold thin films with controlled morphologies and their applications in electrocatalysis and SERS
Nanotechnology, 2012, 23, 25, Article number 255705 (7 pp.), IOP

Gamez,G. ; Frey,D.; Michler,J.
Push-broom hyperspectral imaging for elemental mapping with glow discharge optical emission spectrometry
J. Anal. Atom. Spectrom., 2012, 27, 1, 50-55, RSC

Gamez,G. ; Voronov,M.; Ray,S.J. ; Hoffmann,V. ; Hieftje,G.M. ; Michler,J.
Surface elemental mapping via glow discharge optical emission spectroscopy
Spectrochim. Acta, Part B, 2012, 70, 1-9, Elsevier

Leinenbach,C.; Weyrich,N.; Elsener,H.R.; Gamez,G.
Al2O3–Al2O3 and Al2O3–Ti Solder Joints: Influence of Ceramic Metallization and Thermal Pretreatment on Joint Properties
Int. J. Appl. Ceram. Tec., 2012, 9, 4, 751-763, Wiley

Lyons,P.E.; De,S.; Elias,J.; Schamel,M.; Philippe,L. ; Bellew,A.T.; Boland,J.J. ; Coleman,J.N.
High-performance transparent conductors from networks of gold nanowires
J. Phys. Chem. Lett., 2012, 2, 24, 3058-3062, ACS

Pfetzing-Micklich,J.; Ghisleni,R.; Simon,T.; Somsen,C. ; Michler,J. ; Eggeler,G.
Orientation dependence of stress-induced phase transformation and dislocation plasticity in NiTi shape memory alloys on the micro scale
Mat. Sci. Eng. A, 2012, 538, 265-271, Elsevier

Raghavan,R.; Bechelany,M.; Parlinska,M.; Frey,D.; Mook,W.M.; Beyer,A.; Michler,J. ; Utke,I.
Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties
Appl. Phys. Lett., 2012, 100, 19, Article number 191912 (4 pp.), AIP

Raghavan,R.; Kombaiah,B.; Döbeli,M.; Erni,R. ; Ramamurty,U. ; Michler,J.
Nanoindentation response of an ion irradiated Zr-based bulk metallic glass
Mat. Sci. Eng. A, 2012, 532, 407-413, Elsevier

Schwaiger,R. ; Weber,M.; Moser,B.; Gumbsch,P. ; Kraft,O.
Mechanical assessment of ultrafine-grained nickel by microcompression experiment and finite element simulation
J. Mater. Res., 2012, 27, 1, 266-277, MRS; Cambridge University Press

Wang,Z.; Mook,W.M.; Niederberger,C. ; Ghisleni,R.; Philippe,L. ; Michler,J.
Compression of nanowires using a flat indenter: diametrical elasticity measurement
Nano Lett., 2012, 12, 5, 2289-2293, ACS

Wheeler,J.M. ; Raghavan,R.; Michler,J.
Temperature invariant flow stress during microcompression of a Zr-based bulk metallic glass
Scripta Mater., 2012, 67, 2, 125-128, Elsevier

Whitby,J.A.; Östlund,F. ; Horvath,P.; Gabureac,M.; Riesterer,J. ; Utke,I.; Hohl,M.; Sedláček,L.; Jiruše,J.; Friedli,V. ; Bechelany,M.; Michler,J.
High spatial resolution time-of-flight secondary ion mass spectrometry for the masses: a novel orthogonal ToF FIB-SIMS instrument with in situ AFM
Advances in Materials Science and Engineering, 2012, Article number 180437 (13 pp.), Hindawi

Bechelany,M.; Elias,J.; Brodard,P.; Michler,J. ; Philippe,L.
Electrodeposition of amorphous silicon in non-oxygenated organic solvent
Thin Solid Films, 2011, Article in Press, Elsevier

Sturzenegger,P.N.; Gonzenbach,U.T.; Bürki,G. ; Gauckler,L.J.
Hollow calcium aluminate microcapsules with porous shell microstructure and unique mechanical properties
J. Mater. Chem., 2011, 21, 41, 16524-16528, RSC

Jenke,M.G.; Lerose,D. ; Niederberger,C. ; Michler,J. ; Christiansen,S.; Utke,I.
Toward local growth of individual nanowires on three-dimensional microstructures by using a minimally invasive catalyst templating method
Nano Lett., 2011, 11, 10, 4213-4217, ACS

Wheeler,J.M. ; Raghavan,R.; Michler,J.
In situ SEM indentation of a Zr-based bulk metallic glass at elevated temperatures
Mat. Sci. Eng. A, 2011, 528, 29-30, 8750-8756, Elsevier

Mushtaq,S. ; Pickering,J.C. ; Steers,E.B.M.; Horvath,P.; Whitby,J.A.; Michler,J.
The role of oxygen in analytical glow discharges: GD-OES and GD-ToF-MS studies
J. Anal. Atom. Spectrom., 2011, 26, 9, 1746-1755, RSC

Barnes,E.O.; Wang,Y.; Limon-Petersen,J.G.; Belding,S.R. ; Compton,R.G.
Voltammetry in the absence of excess supporting electrolyte - ECE-DISP1 reactions: the electrochemical reduction of 2-nitrobromobenzene in acetonitrile solvent
J. Electroanal. Chem., 2011, 659, 1, 25-35, Elsevier

Utke,I.; Jenke,M.G.; Röling,C.; Thiesen,P.H.; Iakovlev,V. ; Sirbu,A.; Mereuta,A. ; Caliman,A. ; Kapon,E.
Polarisation stabilisation of vertical cavity surface emitting lasers by minimally invasive focused electron beam triggered chemistry
Nanoscale, 2011, 3, 7, 2718-2722, RSC

Dejeu,J.; Bechelany,M.; Rougeot,P.; Philippe,L. ; Gauthier,M.
Adhesion control for micro- and nanomanipulation
ACS Nano, 2011, 5, 6, 4648-4657, ACS

Lévy-Clément,C.; Wang,X.; Benoit-Moez,C.; Elias,J. ; Philippe,L. ; Michler,J.
Applications of colloidal crystal patterning for synthesis of 1D and 3D nanostructured semiconductors
Phys. Stat. Sol. A, 2011, 208, 6, 1426-1432, Wiley-Blackwell

Elias,J.; Philippe,L. ; Michler,J. ; Lévy-Clément,C.
Mechanism of formation of urchin-like ZnO
Electrochim. Acta, 2011, 56, 26, 9532-9536, Elsevier

Gamez,G. ; Zhu,L. ; Disko,A.; Chen,H. ; Azov,V.; Chingin,K. ; Krämer,G.; Zenobi,R.
Real-time, in vivo monitoring and pharmacokinetics of valproic acid via a novel biomarker in exhaled breath
Chem. Commun., 2011, 47, 17, 4884-4886, RSC

Schmitt,S.W.; Gamez,G. ; Sivakov,V. ; Schubert,M.; Christiansen,S.H. ; Michler,J.
Chemical and optical characterisation of atomic layer deposition aluminium doped ZnO films for photovoltaics by glow discharge optical emission spectrometry
J. Anal. Atom. Spectrom., 2011, 26, 4, 822-827, RSC

Gamez,G.
Weaving the glow discharge net - editorial
J. Anal. Atom. Spectrom., 2011, 26, 4, 649-652, RSC

Estili,M.; Kawasaki,A.; Pittini-Yamada,Y.; Utke,I.; Michler,J.
In situ characterization of tensile-bending load bearing ability of multi-walled carbon nanotubes in alumina-based nanocomposites
J. Mater. Chem., 2011, 21, 12, 4272-4278, RSC

Beaber,A.R. ; Nowak,J.D.; Ugurlu,O. ; Mook,W.M.; Girshick,S.L. ; Ballarini,R. ; Gerberich,W.W.
Smaller is tougher
Philos. Mag., 2011, 91, 7-9, 1179-1189, Taylor & Francis

Elias,J.; Michler,J. ; Philippe,L. ; Lin,M.Y.; Couteau,C. ; Lerondel,G. ; Lévy-Clément,C.
ZnO nanowires, nanotubes, and complex hierarchical structures obtained by electrochemical deposition
J. Electron. Mater., 2011, 40, 5, 728-732, IEEE; TMS; Springer

Cordill,M.J.; Moody,N.R.; Jungk,J.M. ; Kennedy,M.S. ; Mook,W.M.; Prasad,S.V. ; Bahr,D.F. ; Gerberich,W.W.
Probing the strain hardening response of small wear volumes with nanoindentation
Metall. Mater. Trans. A, 2011, 42, 8, 2226-2232, TMS; ASM; Springer

Dabirian,A. ; Kuzminykh,Y.; Sandu,S.C. ; Harada,S.; Wagner,E.; Brodard,P.; Benvenuti,G. ; Rushworth,S. ; Muralt,P. ; Hoffmann,P.
Combinatorial high-vacuum chemical vapor deposition of textured hafnium-doped lithium niobate thin films on sapphire
Cryst. Growth Des., 2011, 11, 1, 203-209, ACS

Eisenhawer,B.; Zhang,D.; Clavel,R. ; Berger,A.; Michler,J. ; Christiansen,S.
Growth of doped silicon nanowires by pulsed laser deposition and their analysis by electron beam induced current imaging
Nanotechnology, 2011, 22, 7, Article number 075706 (7 pp.), IOP

Pathak,S.; Guinard,M. ; Vernooij,M.G.C.; Cousin,B.; Wang,Z.; Michler,J. ; Philippe,L.
Influence of lower current densities on the residual stress and structure of thick nickel electrodeposits
Surf. Coat. Tech., 2011, 205, 12, 3651-3657, Elsevier

Heiroth,S.; Ghisleni,R.; Lippert,T.; Michler,J. ; Wokaun,A.
Optical and mechanical properties of amorphous and crystalline yttria-stabilized zirconia thin films prepared by pulsed laser deposition
Acta Mater., 2011, 59, 6, 2330-2340, Elsevier

Dabirian,A. ; Harada,S.; Kuzminykh,Y.; Sandu,S.C. ; Wagner,E.; Benvenuti,G. ; Brodard,P.; Rushworth,S. ; Muralt,P. ; Hoffmann,P.
Combinatorial chemical beam epitaxy of lithium niobate thin films on sapphire
J. Electrochem. Soc., 2011, 158, 2, D72-D76, ECS; AIP

Adusumalli,R.B.; Koodakal,R.R.; Ghisleni,R.; Zimmermann,T.; Michler,J.
Deformation and failure mechanism of secondary cell wall in Spruce late wood
Appl. Phys. A, 2010, 100, 2, 447-452, Springer

Adusumalli,R.B.; Koodakal,R.R.; Schwaller,P.Zimmermann,T.; Michler,J.
In situ SEM micro-indentation of single wood pulp fibres in transverse direction
J. Electron. Microsc., 2010, 59, 5, 345-349, Oxford University Press; JEM
 
Adusumalli,R.B.; Mook,W.M.; Passas,R.; Schwaller; Michler,J.
Nanoindentation of single pulp fibre cell walls
J. Mater. Sci., 2010, 45, 10, 2558-2563, Springer
 
Adusumalli,R.B.; Weber,H.K.; Roeder,T.; Sixta,H.
Evaluation of experimental parameters in the microbond test with regard to lyocell fibers
J. Reinf. Plast. Comp., 2010, 29, 15, 2356-2367, Sage
 
Alberts,D.; Horvath,P.; Nelis,Th.; Pereiro,R.; Bordel,N.; Michler,J.
Time-resolved measurement of emission profiles in pulsed radiofrequency glow discharge optical emission spectroscopy: investigation of the pre-peak
Spectrochim. Acta B, 2010, 65, 7, 533-541, Elsevier
 
Bechelany,M.; Brodard,P.; Elias,J.; Michler,J.;Philippe,L.
Simple synthetic route for SERS-active gold nanoparticles substrate with controlled shape and organization
Langmuir, 2010, 26, 17, 14364-14371, ACS

Bechelany,M.; Mäder,X.; Riesterer,J.;Hankache,J.; Lerose,D.; Christiansen,S.; Michler,; Philippe,L.  
Synthesis mechanisms of organized gold nanoparticles: Influence of annealing temperature and atmosphere
Cryst. Growth Des., 2010, 10, 2, 587-596, ACS
 
Bernau,L.; Gabureac,M.; Erni,R.; Utke,I.  
Tunable nanosynthesis of composite materials by electron-impact reaction
Angew. Chem. Int. Edit., 2010, 49, 47, 8880-8884, Wiley-Blackwell
 
Bidiville,A.; Wasmer,K.; Michler,J.; Nasch,P.M.; Van Der Meer,M.; Ballif,C.
Mechanisms of wafer sawing and impact on wafer properties
Prog. Photovoltaics, 2010, 18, 8, 563-572, Wiley
 
Canulescu,S.; Molchan,I.S.; Tauziede,C.; Tempez,A.; Whitby,J.A.; Thompson,G.E.; Skeldon,P.; Chapon,P.; Michler,J.
Detection of negative ions in glow discharge mass spectrometry for analysis of solid specimens
Anal. Bioanal. Chem., 2010, 396, 8, 2871-2879, Springer
 
Dejeu,J.; Bechelany,M.; Philippe,L.; Rougeot,P.; Michler,J.; Gauthier,M.  
Reducing the adhesion between surfaces using surface structuring with PS latex particle
ACS Appl. Mater. Interfaces, 2010, 2, 6, 1630-1636, ACS
 
Elias,J.; Léuy-Clément,C.; Bechelany,M.; Michler,J.; Wang,G.Y.; Wang,Z.; Philippe,L.
Hollow urchin-like ZnO thin films by electrochemical deposition
Adv. Mater., 2010, 22, 14, 1607-1612, Wiley
 
Gabureac,M.; Bernau,L.; Utke,I.; Boero,G.
Granular Co-C nano-Hall sensors by focused-beam-induced deposition
Nanotechnology, 2010, 21, 11, Article number 115503 (5 pp.), IOP
  
Koodakal,R.R.; Boopathy,K.; Ghisleni,R.; Pouchon,M.A.; Ramamurty,U.; Michler,J. 
Ion irradiation enhances the mechanical performance of metallic glasses
Scripta Mater., 2010, 62, 7, 462-465, Elsevier
 
Lerose,D.; Bechelany,M.; Philippe,L.; Michler,J.; Christiansen,S.  
Ordered arrays of epitaxial silicon nanowires produced by nanosphere lithography and chemical vapor deposition
J. Cryst. Growth, 2010, 312, 20, 2887-2891, Elsevier

Maeder,X.; Niederberger,C.; Christiansen,S.; Bochmann,A.; Andrä,G.; Gawlik,A.; Falk,F.; Michler,J.
Microstructure and lattice bending in polycrystalline laser-crystallized silicon thin films for photovoltaic applications
Thin Solid Films, 2010, 519, 1, 58-63, Elsevier
 
Miyazoe,H.; Utke,I.; Kikuchi,H.; Kiriu,S.; Friedli,V.; Michler,J.; Terashima,K.
Improving the metallic content of focused electron beam-induced deposits by a scanning electron microscope integrated hydrogen-argon microplasma generator
J. Vac. Sci. Technol. B, 2010, 28, 4, 744-750, AIP; AVS
 
Mook,W.M.; Niederberger,C.; Bechelany,M.; Philippe,L.; Michler,J.
Compression of freestanding gold nanostructures: from stochastic yield to predictable flow
Nanotechnology, 2010, 21, 5, Article number 055701 (9 pp.), IOP
 
Niederberger,C.; Mook,W.M.; Maeder,X.; Michler,J. 
In situ electron backscatter diffraction (EBSD) during the compression of micropillars
Mater. Sci. Eng. A, 2010, 527, 16-17, 4306-4311, Elsevier
 
Nowak,J.D.; Rzepiejewska-Malyska,K.A.; Major,R.C.; Warren,O.L.; Michler,J.
In-situ nanoindentation in the SEM
Mater. Today, 2010, 12, Suppl. 1, 44-45, Elsevier
 
Pathak,S.; Kuebler,J.; Payzant,A.; Orlovskaya,N.  
Mechanical behavior and electrical conductivity of La1-xCaxCoO3 (x = 0, 0.2, 0.4, 0.55) perovskites
J. Power Sources, 2010, 195, 11, 3612-3620, Elsevier
 
Philippe,L.; Cousin,B.; Wang,Z.; Zhang,D.; Michler,J.
Mass density of individual cobalt nanowires
Appl. Phys. Lett., 2010, 96, 5, Article number 051903 (3 pp.), AIP
 
Pouchon,M.A.A; Chen,J.; Ghisleni,R.; Michler,J.; Hoffelner,W.  
Characterization of irradiation damage of ferritic ODS alloys with advanced micro-sample methods
Exp. Mech., 2010, 50, 1, 79-84, Springer
 
Radice,S.; Bradbury,C.R.; Michler,J.; Mischler,S.  
Critical particle concentration in electrophoretic deposition
J. Eur. Ceram. Soc., 2010, 30, 5, 1079-1088, Elsevier
 
Radice,S.; Dietsch,H.; Mischler,S.; Michler,J.
Electrophoretic deposition of functionalized polystyrene particles for TiO2 multi-scale structured surfaces
Surf. Coat. Tech., 2010, 204, 11, 1749-1754, Elsevier
 
Spolenak,R.; Ludwig,W.; Buffiere,J.Y.; Michler,J.  
In situ elastic strain measurements - diffraction and spectroscopy
MRS Bull., 2010, 35, 5, 368-374, MRS
  
Utke,I.; Gabureac,M.; Friedli,V.; Bernau,L.; Michler,J.
In-situ monitoring of gas-assisted focused ion beam and focused electron beam induced processing
J. Phys. Conf. Ser., 2010, 241, 1, Article number 012072 (6 pp.), IOP, Sheffield, UK

Utke,I.; Gölzhäuser,A. 
Klein, minimal-invasiv, direkt: Elektronen induzieren lokale Reaktionen adsorbierter funktioneller Molekülen auf der Nanometerskala
Angew. Chem., 2010, 122, 49, 9516-9518, Wiley-Blackwell
 
Utke,I.; Gölzhäuser,A.  
Small, minimally invasive, direct: electrons induce local reactions of adsorbed functional molecules on the nanoscale
Angew. Chem. Int. Edit., 2010, 49, 499, 9328-9330, Wiley-Blackwell
 
Vaucher,S.; Bernau,L.; Stir,M.; Ishizaki,K.; Català-Civera,J.M.; Nicula,R.  
Microwave-induced electromigration in multicomponent metallic alloys
IEEE MTT-S, 2010, 1440-1443 (Article number 5517705), IEEE, Anaheim Ca., USA
 
Wang,Z.; Devel,M.; Dulmet,B.  
Twisting carbon nanotubes: a molecular dynamics study
Surf. Sci., 2010, 604, 5-6, 495-498, Elsevier
 
Wang,Z.; Philippe,L.; Elias,J.  
Deflection of suspended graphene by a transverse electric field
Phys. Rev. B, 2010, 81, 15, Article number 155405 (5 pp.), APS
 
Wang,Z.; Scharstein,R.W. 
Electrostatics of graphene: charge distribution and capacitance
Chem. Phys. Lett., 2010, 489, 4-6, 229-236, Elsevier
 
Wurz,P.; Whitby,J.A.; Rohner,U.; Martín-Fernández,J.A.; Lammer,H.; Kolb,C.  
Self-consistent modelling of Mercury's exosphere by sputtering, micro-meteorite impact and photon-stimulated desorption
Planet. Space Sci., 2010, 58, 12, 1599-1616, Elsevier
 
Zhang,D.  
A nano-tensile testing system for studying nanostructures inside an electron microscope : design, characterization and application
2010, 140 pp., EPF Lausanne; Empa Thun, Switzerland, Dissertation
 
Zhang,D.; Breguet,J.M.; Clavel,R.; Sivakov,V.; Christiansen,S.; Michler,J.
In situ electron microscopy mechanical testing of silicon nanowires using electrostatically actuated tensile stages
J. Microelectromech. S., 2010, 19, 3, 663-674, IEEE; ASME
 
Zhu,L.; Hu,Z.; Gamez,G.; Law,W.S.; Chen,H.; Yang,S.; Chingin,K.; Balabin,R.M.; Wang,R.; Zhang,T.; Zenobi,R.
Simultaneous sampling of volatile and non-volatile analytes in beer for fast fingerprinting by extractive electrospray ionization mass spectrometry
Anal. Bioanal. Chem., 2010, 398, 1, 405-413, Springer

Bechelany,M.; Brodard,P.; Philippe,L. ; Michler,J.
Extended domains of organized nanorings of silver grains as surface-enhanced Raman scattering sensors for molecular detection
Nanotechnology, 2009, 20, 45, Article number 455302 (8pp.), IOP
 
Boehm-Courjault,E.; Gonzales,F.; Jacot,A. ; Kohler,F.; Mariaux,A.; Niederberger,C.; Salgado-Ordorica,M.A.; Rappaz,M.  
EBSD: a powerful microstructure analysis technique in the field of solidification
J. Microsc., 2009, 233, 1, 160-169, Wiley-Blackwell

Canulescu,S.; Papadopoulou,E.L.; Anglos,D.; Lippert,T.; Schneider,C.W.; Wokaun,A.
Mechanisms of the laser plume expansion during the ablation of LiMn2O4
J. Appl. Phys., 2009, 105, 6, Article number 063107 (11 pp.), AIP
 
Canulescu,S.; Whitby,J.A.; Fuhrer,K.; Hohl,M.; Gonin,M. ; Horvath,T.; Michler,J.   
Potential analytical applications of negative ions from a pulsed radiofrequency glow discharge in argon
J. Anal. Atom. Spectrom., 2009, 24, 2, 178-180, RSC

Crowther,S.A.; Whitby,J.A.; Busfield,A. ; Holland,G.; Busemann,H. ; Gilmour,J.D.
Collisional modification of the acapulcoite/lodranite parent body revealed by the iodine-xenon system in lodranites
Meteorit. Planet. Sci., 2009, 44, 8, 1151-1159, University of Arizona
 
Dubach,A.; Koodakal,R.R.; Löffler,J.F. ; Michler,J.; Ramamurty,U.
Micropillar compression studies on a bulk metallic glass in different structural states
Scripta Mater., 2009, 60, 7, 567-570, Elsevier
 
Dubach,A.; Prasad,K.E. ; Koodakal,R.R.; Löffler,J.F.; Michler,J. ; Ramamurty,U.  
Free-volume dependent pressure sensitivity of Zr-based bulk metallic glass
J. Mater. Res., 2009, 24, 8, 2697-2704, MRS
 
Erisman,J.W.; Bleeker,A.; Neftel,A.; Aneja,V.; Hutchings,N.; Kinsalla,L.; Tang,Y.S.; Webb,J.; Sponar,M.; Raes,C.; Mitosinkova,M.;  Vidic,S.; Andersen,H.V. ; Klimont,Z.; Pinder,R.; Baker,S.; Reidy,B.; Flechard,C.; Horvath,L.;  Lewandowska,A.; Gillespie,C.; Wallasch,M.; Gehrig,R.; Ellerman,T.  
Detecting change in atmospheric ammonia following emission changes
2009, 383-390, Springer
 
Friedli,V. ; Utke,I.  
Optimized molecule supply from nozzle-based gas injection systems for focused electron- and ion-beam induced deposition and etching: simulation and  experiment
J. Phys. D Appl. Phys., 2009, 42, 12, Article number 125305 (11 pp.), IOP

Friedli,V. ; Utke,I.; Mølhave,K.;  Michler,J.   
Dose and energy dependence of mechanical properties of focused electron-beam-induced pillar deposits from Cu(C5HF6O2)2
Nanotechnology, 2009, 20, 38, Article number 385304 (11 pp.), IOP

Gerberich,W.W.; Michler,J. ;Mook,W.M.; Ghisleni,R.; Östlund,F. ; Stauffer,D.D.; Ballarini,R.
Scale effects for strength, ductility, and toughness in "brittle" materials
J. Mater. Res., 2009, 24, 3, 898-906, MRS

Ghisleni,R.; Rzepiejewska-Malyska,K.; Philippe,L. ; Schwaller,P.A; Michler,J.   
In situ SEM indentation experiments: instruments, methodology, and applications
Microsc. Res. Techniq., 2009, 72, 3, 242-249, Wiley
 
Gilmour,J.D.; Crowther,S.A.; Busfield,A.; Holland,G.; Whitby,J.A.  
An early I-Xe age for CB chondrite chondrule formation, and a re-evaluation of the closure age of Shallowater enstatite
Meteorit. Planet. Sci., 2009, 44, 4, 573-579, University of Arizona
 
Hadad,M.; Bandyopadhyay,P.P.; Michler,J.; Lesage,J.  
Tribological behaviour of thermally sprayed Ti-Cr-Si coatings
Wear, 2009, 267, 5-8, 1002-1008, Elsevier 
 
Hoffmann,S.; Bauer,J.; Ronning,C.; Stelzner,T.; Michler,J. ; Ballif,C.; Sivakov,V. ; Christiansen,S.H.
Axial p-n junctions realized in silicon nanowires by ion implantation
Nano Lett., 2009, 9, 4, 1341-1344, ACS
 
Jennett,N.M.; Ghisleni,R.; Michler,J.   
Enhanced yield strength of materials: the thinness effect
Appl. Phys. Lett., 2009, 95, 12, Article number 123102 (3 pp.), AIP
 
Kappenberger,P.; Luo,F.; Heyderman,L.J.; Solak,H.H.; Padeste,C.; Brombacher,C. ;Makarov,D.; Ashworth,T.V.; Philippe,L. ; Hug,H.J.; Albrecht,M. 
Template-directed self-assembled magnetic nanostructures for probe recording
Appl. Phys. Lett., 2009, 95, 2, Article number 023116 (3 pp.), AIP

Koodakal,R.R.; Murali,P. ; Ramamurty,
On factors influencing the ductile-to-brittle transition in a bulk metallic glass
Acta Mater., 2009, 57, 11, 3332-3340, Elsevier
 
Koodakal,R.R.; Shastry,V.V.; Kumar,A.; Jayakumar,T.; Ramamurty,U.   
Toughness of as-cast and partially crystallized composites of a bulk metallic glass
Intermetallics, 2009, 17, 10, 835-839, Elsevier
 
Lobo,L.; Pisonero,J.; Bordel,N.; Pereiro,R.; Tempez,A.; Chapon,P.; Michler,J. ; Hohl,M.;Sanz-Medel,A.  
A comparison of non-pulsed radiofrequency and pulsed radiofrequency glow discharge orthogonal time-of-flight mass spectrometry for analytical purposes
J. Anal. Atom. Spectrom., 2009, 24, 10, 1373-1381, RSC

Molchan,I.S.; Thompson,G.E.;Skeldon,P.; Trigoulet,N.; Chapon,P.; Tempez,A.; Malherbe,J.; Lobo Revilla,L.; Bordel,N.; Belenguer,P.; Nelis,T. ; Zahri,A.; Guillot,P. ; Ganciu,M.; Michler,J. ; Hohl,M.  
The concept of plasma cleaning in glow discharge spectrometry
J. Anal. Atom. Spectrom., 2009, 24, 6, 734-741, RSC
 
Östlund,F. ; Rzepiejewska-Malyska,K.; Leifer,K.; Hale,L.M.; Tang,Y.; Ballarini,R.; Gerberich,W.W.; Michler,J.   
Brittle-to-ductile transition in uniaxial compression of silicon pillars at room temperature
Adv. Funct. Mater., 2009, 19, 15, 2439-2444, Wiley-Blackwell
 
Pathak,S.; Cambaz,Z.G.;Kalidindi,S.R.; Swadener,J.G. ; Gogotsi,Y. 
Viscoelasticity and high buckling stress of dense carbon nanotube brushes
Carbon, 2009, 47, 8, 1969-1976, Elsevier
 
Pathak,S.; Steinmetz,D.; Kuebler,J.; Andrew Payzant,E.; Orlovskaya,N.
Mechanical behavior of La0.8Sr0.2Ga0.8Mg0.2O3 perovskites
Ceram. Int., 2009, 35, 3, 1235-1241, Elsevier
 
Pathak,S.; Stojakovic,D. ;  Kalidindi,S.R. 
Measurement of the local mechanical properties in polycrystalline samples using spherical nanoindentation and orientation imaging microscopy
Acta Mater., 2009, 57, 10, 3020-3028, Elsevier
 
Peyrot,I.; Bouchard,P.O.; Ghisleni,R.; Michler,J.   
Determination of plastic properties of metals by instrumented indentation using a stochastic optimization algorithm
J. Mater. Res., 2009, 24, 3, 936-947, MRS
 
Philippe,L. ; Wang,Z.; Peyrot,I.; Hassel,A.W.; Michler,J.   
Nanomechanics of rhenium wires: elastic modulus, yield strength and strain hardening
Acta Mater., 2009, 57, 14, 4032-4035, Elsevier
 
Radice,S.  
Electrophoretic deposition of multi-scale structured TiO2 surfaces
2009, 170 pp., EPF Lausanne; Empa Thun, Switzerland, Dissertation
 
Rzepiejewska-Malyska,K.; Mook,W.M.; Parlinska-Wojtan,M.; Hejduk,J. ; Michler,J.
In situ scanning electron microscopy indentation studies on multilayer nitride films: methodology and deformation mechanisms
J. Mater. Res., 2009, 24, 3, 1208-1221, MRS
 
Rzepiejewska-Malyska,K.; Parlinska-Wojtan,M.; Wasmer,K.; Hejduk,K. ; Michler,J.
In situ SEM indentation studies of the deformation mechanisms in TiN, CrN and TiN/CrN
Micron, 2009, 40, 1, 22-27, Elsevier
 
Schwaller,P.; Züst,R. ;Michler,J.   
Quantitative topographical characterization of thermally sprayed coatings by optical microscopy
J. Therm. Spray. Techn., 2009, 18, 1, 96-102, Springer
 
 
Tarik,M.; Lotito,G. ; Whitby,J.A.; Koch,J.; Fuhrer,K.; Gonin,M. ; Michler,J. ;  Bolli,J.L.; Günther,D.  
Development and fundamental investigation of Laser Ablation Glow Discharge Time-Of-Flight Mass Spectrometry (LA-GD-TOFMS)
Spectrochim. Acta B, 2009, 64, 3, 262-270, Elsevier

Tempez,A.; Canulescu,S.;Molchan,I.S.; Döbeli,M.; Whitby,J.A.; Lobo,L.; Michler,J. ; Thompson,G.E.; Bordel,N.; Chapon,P.; Skeldon,P.; Delfanti,I.; Tuccitto,N.;Licciardello,A.  
18O/16O isotopic separation in anodic tantala films by glow discharge time-of-flightmass spectrometry
Surf. Interface Anal., 2009, 41, 12-13, 966-973, Wiley
 
Vernooij,M.G.C.; Mohr,M.; Tzvetkov,G.; Zelenay,V.; Huthwelker,T.; Kaegi,R.; Gehrig,R. ;Grobéty,B.   
On source identification and alteration of single diesel and wood smoke soot particles in the atmosphere: an X-ray microspectroscopy study
Environ. Sci. Technol., 2009, 43, 14, 5339-5344, ACS
 
Wang,Z.  
Alignment of graphene nanoribbons by an electric field
Carbon, 2009, 47, 13, 3050-3053, Elsevier
 
Wang,Z.  
Effects of substrate and electric fields on charges in carbon nanotubes
Phys. Rev. B, 2009, 79, 15, Article number 155407 (6 pp.), APS
 

Wang,Z.; Philippe,L.   
Deformation of doubly clamped single-walled carbon nanotubes in an electrostatic field
Phys. Rev. Lett., 2009, 102, 21, Article number 215501 (4 pp.), APS

Zhang,D.; Breguet,J.M.; Clavel,R. ; Phillippe,L.; Utke,I.; Michler,J.
In situ tensile testing of individual Co nanowires inside a scanning electron microscope
Nanotechnology, 2009, 20, 36, Article number 365706 (7 pp.), IOP
 
Zhang,D.; Drissen,W.; Breguet,J.M.; Clavel,R. ; Michler,J.
A high-sensitivity and quasi-linear capacitive sensor for nanomechanical testing applications
J. Micromech. Microeng., 2009, 19, 7, Article number 075003 (10 pp.), IOP

Becker, M.; Sivakov, V.; Gösele, U.; Stelzner, T.; Andrà, G.; Reich, Hans J.; Hoffmann, S.; Michler, J.; Christiansen, S. "Nanowires Enabling Signal-Enhanced Nanoscale Raman Spectroscopy", Small, 4, 4, 2008, p 398-404, ISSN/ISBN: 1613-6829

Berger, B.; Haas, B.; Weiser, V.; Kelzenebrg, S.; Jäggi, C.; Aeberhard, M."Correlation between Particle Size and Performance of Pyrotechnic Compositions", 33th International Annual Conference of ICT am Fraunhofer Institut für Chemische Technologie, Karlsruhe, D, 24.-27.6.,

Bidiville, A.; Wasmer, K.; Michler, J.; Ballif, Ch.; Van der Meer, M.; Nasch, P. "Towards the Correlation of Mechanical Properties and Sawing Parameters of Silicon Wafers", 22nd European Photovoltaic Solar Energy Conference, Milano, IT, 3.-7.9., p 1130-1134,

Boehm-Courjault, E.; Gonzales, F.; Jacot, A.; Kohler, F.; Mariaux, A.; Niederberger, Chr.; Salgado-Ordorica, M. A.; Rappaz, M. "EBSD: A Powerful Microstructure Analysis Technique in the Field of Solidification", Journal of Microscopy, 2008,

Castellero, A.; Moser, B.; Uhlenhaut, D.I.; Dalla Torre, F.H.; Löffler, J.F "Room-temperature creep and structural relaxation of Mg–Cu–Y metallic glasses", Acta Materialia, 56, 15, 2008, p 3777-3785, ISSN/ISBN: 1359-6454

Deuschle, Julia K.; Bürki, G.; Deuschle, Matthias H.; Enders, S.; Michler, J.; Arzt, E. "In situ indentation testing of elastomers", Acta Materialia, 56, 16, 2008, p 4390-4401, ISSN/ISBN: 1359-6454

Ghisleni, R.; Rzepiejewska-Malyska, K.; Philippe, L.; Schwaller, P.; Michler, J. "In-situ SEM indentation experiments: instruments, methodology, applications", Microscopy Research Technique, 2008, 

Niederberger, Chr.; Michler, J.; Jacot, A. "Origin of intragranular crystallographic misorientations in hot-dip Al-Zn-Si coatings", Acta Materialia, 46, 15, 2008, p 4002-4011, ISSN/ISBN: 1359-6454

Östlund, F.; Rzepiejewska-Malyska, K.; Leifer, K.; Michler, J. "Brittle - Ductile transition in uniaxial compression of silicon pillars at room temperature", Small, 2008,

Pathak, S.; Kalidindi, S.R.; Moser, B.; Klemenz, C.; Orlovskaya, N. "Analyzing indentation behavior of LaGaO3 single crystals using sharp indenters", Journal of European Ceramic Society, 28, 10, 2008, p 2039-2047, ISSN/ISBN: 0955-2219

Philippe, L.; Heiss, L.; Michler, J. "Electroplating of Stainless Steel", Chemistry of Materials, 20, 24, 2008, p 3377-3384,

Philippe, L.; Michler, J. "A Kinetic Model Enabling Controlled Electrosynthesis of Stacked Metallic Nanotubes and Nanowires", Small, 4, 7, 2008, p 904-907, ISSN/ISBN: 1613-6829

Philippe, L.; Schwaller, P.; Bürki, G.; Michler, J. "A comparison of microtensile and microcompression methods for studying plastic properties of nanocrystalline electrodeposited nickel at different length scales", Journal of Material Research, 23, 5, 2008, p 1383-1388,

Raabe, J.; Tzvetkov, G.; Flechsig, U.; Böge, M.; Jaggi, A.$; Sarafimov, B.; Vernooij, M. G. C. ; Huthwelker, T.; Ade, H.; Kilcoyne, D.; Tyliszczak, T.; Fink, R. H. ; Quitmann, C."PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source", Review of Scientific Instruments, 79, 2008, p 10, ISSN/ISBN: 0034-6748
 
Radice, S.; Kern, P.; Dietsch, H.; Mischler, S.; Michler, J. "Methods for functionalization of microsized polystyrene beads with titania nanoparticles for cathodic electrophoretic deposition", Journal of Colloid and Interface Science, 318, 2, 2008, p 264-270, ISSN/ISBN: 0021-9797

Rzepiejewska-Malyska, K.; Buerki, G.; Michler, J.; Major, R.; Cyrankowski, E.; Asif, S.A.S.; Warren, OL."In situ mechanical observations during nanoindentation inside a high-resolution scanning electron microscope", Journal of Material Research, 23, 7, 2008, p 1973-1979, ISSN/ISBN: 0884-2914

Rzepiejewska-Malyska, K.; Hejduk, K.; Parlinska-Wojtan, M.; Michler, J. "In-situ SEM indentation studies of the multilayer nitride films: methodology and deformation mechanisms", Journal of Materials Research, 2008,

Rzepiejewska-Malyska, K.; Parlinska-Wojtan, M.; Wasmer, K.; Hejduk, K.; Michler, J. "In-situ SEM indentation studies of the deformation mechanisms in TiN, CrN and TiN/CrN", Micron, 2008,

Sakamoto, S.; Philippe, L.; Bechelany, M.; Michler, J.; Asoh, H; Ono, S."Ordered hexagonal array of Au nanodots on Si substrate based on colloidal crystal templating", Nanotechnology, 19, 40, 2008, p 6, ISSN/ISBN: 0957-4484

Santinacci, L.; Djenizian, T.; Schwaller, P.; Suter, T.; Etcheberry, A.; Schmuki, P. "Selective electrochemical gold deposition onto p-Si (100) surfaces", Journal of Physics D: Applied Physics, 41, 17, 2008, p 9, ISSN/ISBN: 0022-3727

Utke, I.; Hoffmann, P.; Melngailis, J."Review Article: Gas-assisted focused electron beam and ion beam processing and fabrication", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 26, 2008, p 1198-1276, ISSN/ISBN: 1071-1023

Vasić, S.; Grobéty, B.; Kübler, J.; Kern, P.; Graule, T. "Experimental models for activtation mechanism of pressureless infiltration in the non-wetting steel-alumina MMC system", Advanced Engineering Materials, 10, 5, 2008, p 471-475, ISSN/ISBN: 1438-1656
Friedli, V.; Hoffmann, S.; Michler, J.; Utke, I. AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication, 2008, p 247-286, ISSN/ISBN: 978-3-540-74079-7

Miyazoe, H.; Utke, I.; Michler, J.; Terashima, K. Controlled focused electron beam-induced etching for the fabrication of sub-beam-size nanoholes, Applied Physics Letters, 92, 4, 2008, p 3, ISSN/ISBN: 0003-6951

Utke, I.; Friedli, V.; Purrucker, M.; Michler, J. Resolution in focused electron- and ion-beam induced processing, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 25, 6, 2008, p 2219-2223,

Wasmer, K.; Ballif, Ch.; Pouvreau, C.; Schulz, D.; Michler, J. Dicing of gallium–arsenide high performance laser diodes for industrial applications: Part II. Cleavage operation, Journal of Materials Processing Technology, 198, 1-3, 2008, p 105-113, ISSN/ISBN: 0924-0136

V. Friedli, S. Hoffmann, J. Michler and I. Utke,  “AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication” Applied Scanning Probe Methods ASPM Vol. 8-10, Eds. B. Bushan, H. Fuchs, M. Tomitori, Series NanoScience and Technology, ISBN: 978-3-540-74079-7, Springer 2008.

Miyazoe H, Utke I, Michler J, Terashima K Controlled focused electron beam-induced etching for the fabrication of sub-beam-size nanoholes
APPLIED PHYSICS LETTERS   Volume: 92   Issue: 4 Article Number: 043124   Published: JAN 28 2008

Becker, M.; Sivakov, V.; Andra, G.; Geiger, R.; Schreiber, J.; Hoffmann, S.; Michler, J.; Milenin, A. P.; Werner, P.; Christiansen, S. H. The SERS and TERS Effects Obtained by Gold Droplets on Top of Si Nanowires, Nano Letters, 7, 1, 2007, p 75-80, ISSN/ISBN: 1530-6984

Bidiville, A.; Wasmer, K.; Michler, J.; Ballif, Ch.; Van der Meer, M.; Nasch, P. Towards the Correlation of Mechanical Properties and Sawing Parameters of Silicon Wafers, 22nd EU-PVSEC, Milano, I, in press

Brescia, R.; Schreck, M.; Michler, J.; Gsell, S.; Stritzker, B. Interaction of small diamond islands on iridium: A finite element simulation study, Diamond and Related Materials, 16, 4-7, 2007, p 705-710, ISSN/ISBN: 0925-9635

Chistiansen, S.H.; Becker, M.; Fahlbusch, S.; Michler, J.; Sivakov, V.; Andrä, G.; Geiger, R. Signal enhancement in nano-Raman spectroscopy by gold caps on silicon nanowires obtained by vapour-liquid-solid growth, Nanotechnology, 18, 3, 2007, p 6, ISSN/ISBN: 0957-4484

Friedli, V.; Santschi, C.; Michler, J.; Hoffmann, P.; Utke, I. Mass sensor for in-situ monitoring the focused ion and electron beam induced processes, Applied Physics Letters, 90, 2007, ISSN/ISBN: 0003-6951

Gassilloud, R.; Schmuki, P.; Michler, J. Electrochemical trench etching of silicon triggered via mechanical nanocontacts, Electrochimica Acta, 53, 2, 2007, p 758-762, ISSN/ISBN: 0013-468

Hoffmann, S.; Östlund, F.; Michler, J.; Fan, H.J.; Zacharias, M.; Christiansen, S. H.; Ballif, Ch. Fracture strength and Young’s modulus of ZnO nanowires, Nanotechnology, 18, 20, 2007, p 5, ISSN/ISBN: 0957-4484

Kern, P.; Veh, J.; Michler, J. New developments in through-mask electrochemical micromachining of titanium, Journal of Micromechanics and Microengineering, 17, 6, 2007, p 1168-1177, ISSN/ISBN: 0960-1317

Kern, P.; Widmer, R.; Gasser, P.; Michler, J. Local Tuning of Conductivity in Amorphous Titanium Oxide Films by Selective Electron Beam Irradiation, Journal of Physical Chemistry C, 111, 33, 2007, p 13972-13980, ISSN/ISBN: 1932-7447

Michler, J.; Wasmer, K.; Meier, S.; Östlund, F.; Leifer, K. Plastic Deformation of Gallium-Arsenide Micropillars under Uniaxial Compression at Room Temperature, Applied Physics Letters, 90, 4, 2007, p 3, ISSN/ISBN: 0003-6951

Moser, B.; Wasmer, K.; Barbieri, L.; Michler, J. Strength and Fracture of Si Micro-Pillars: A New Scanning Electron Microscopy-Based Micro-Compression Test, Journal of Material Research, 22, 4, 2007, p 1004-1011,

Nelis, T.; Aeberhard, M.; Rohr, L.; Michler, J.; Belenguer, P.; Guillot, P.; Thérèse, L. A simple method for measuring plasma power in rf-GDOES instruments, Analytical and Bioanalytical Chemistry, 389, 3, 2007, p 763-767, ISSN/ISBN: 1618-2642

Philippe, L.; Kacem, N.; Michler, J. Electrochemical Deposition of Metals Inside High Aspect Ratio Nanoelectrode Array: Analytical Current Expression and Multidimensional Kinetic Model for Cobalt Nanostructure Synthesis, The Journal of Physical Chemistry C, 111, 13, 2007, p 5229 - 5235, ISSN/ISBN: 1932-7447

Philippe, L.; Peyrot, I.; Michler, J.; Hassel, A.W.; Milenkovic, S. Yield stress of monocrystalline rhenium nanowires, Applied Physics Letters, 91, 2007, p 3, ISSN/ISBN: 0003-6951

Radice, S.; Kern, P.; Buerki, G.; Michler, J.; Textor, M. Electrophoretic deposition of zirconia-Bioglass composite coatings for biomedical implants, Journal of Biomedical Materials Research Part A, 82, 2, 2007, p 436 - 444, ISSN/ISBN: 1549-3296

Schwaller, P.; Philippe, L.; Bürki, G.; Michler, J. Determination of complete stress-strain curves of UV-LIGA materials from nanoindentation experiments, 2nd Vienna International Conference on Micro- and Nano-Technology 2007, Wien, A, 14.-16.3., p 249 - 255, ISSN/ISBN: 978-3-901657-25-2

Wasmer, K.; Bidiville, A.; Michler, J.; Ballif, Ch.; Van der Meer, M.; Nasch, P. Effect of Strength Test Methods on Silicon Wafer Strength Measurements, 22nd EU-PVSEC, Milano, I, in press

Wasmer, K.; Moser, B.; Pouvreau, C.; Michler, J. An Overview of Nanomaterial Testing Using In-Situ Nanoindenter, COST Action E54, Riga, Latvia, 25.-27.4., p 44-48,

Wasmer, K.; Parlinska-Wojtan, M.; Gassilloud, R.; Pouvreau, C.; Tharian, J.; Michler, J. Plastic Deformation Modes of Gallium-Arsenide in Nanoindentation and Nanoscratching, Applied Physics Letters, 90, 3, 2007, ISSN/ISBN: 0003-6951

Utke I, Friedli V, Purrucker M, Michler J. Resolution in focused electron- and ion-beam induced processing, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B   Volume: 25   Issue: 6   Pages: 2219-2223   Published: NOV 2007

V. Friedli, C. Santschi, J. Michler, P. Hoffmann, I. Utke  Mass sensor for in situ monitoring of focused ion and electron beam induced processes, Appl. Phys. Lett 90, 053106

S. Christiansen, M. Becker, S. Fahlbusch, J. Michler, V. Sivakov, G. Andra, R. Geiger Nanotechnology 18, 035503

M. Becker, V. Sivakov, G. Andra, R. Geiger, J. Schreiber, S. Hoffmann, J. Michler, A.P. Milenin, P. Werner, S. Christiansen The SERS and TERS effects obtained by gold droplets on top of Si nanowires, Nano Letters 7, 75

K. Wasmer, M. Parlinska, C. Pouvreau, R. Gassilloud, J. Tharian, J. Michler  Investigation of Low Load Indent-Scratch with Various Tip Geometries on Gallium-Arsenide, Appl. Phys. Lett., in press

J. Michler, F. Östlund, S. Meier, K. Leifer (2006) Plastic deformation of GaAs micropillars under uniaxial compression, Appl. Phys. Lett. 90, 043123

P. Kern, Y. Muller, J. Patscheider, J. Michler (2006) Electron-beam-induced topographical, chemical, and structural patterning of amorphous titanium oxide films, J. Phys. Chem. B, 23660

B. Moser, K. Wasmer, L. Barbieri, J. Michler (2006) Strength and fracture of Si micro-pillars: A new SEM-based micro-compression test, J. Mater. Res., in press

S.H. Christiansen, M. Becker, S. Fahlbusch, J. Michler, V. Sivakov, G. Andrä, R. Geiger (2006) Signal enhancement in nano-Raman-Spectroscopy by gold caps on Silicon nanowires obtained by vapor-liquid-solid growth, Nanotechnology, in press

L. Philippe, P. Kern and J. Michler (2006) Mass-Transfer Characterisation of a Novel Propeller Plating Cell for MEMS, J. Electrochem. Soc. 153, C755-C760

S. Radice, Ph. Kern, J. Michler, M. Textor (2006) Electrophoretic Deposition of Zirconia-Bioglass Composite Coatings for Biomedical Implants, J. Biomed. Mater. Res., in press

C. Niederberger, J. Michler, A. Jacot (2006) Inverse method for the determination of a mathematical expression for the anisotropy of the solid-liquid interfacial energy in Al-Zn-Si alloys, Phys. Rev. E 74, 021604

S. Hoffmann, I. Utke, B. Moser, J. Michler, S. Christiansen, V. Schmidt, S. Senz, P. Werner, U. Gosele, C. Ballif C (2006) Measurement of the bending strength of vapor-liquid-solid grown silicon nanowires, Nano Letters 6, 622

T. Chudoba, P. Schwaller, R. Rabe, J.-M. Breguet, J. Michler (2006) Comparison of nanoindentation results obtained with Berkovich and cube-corner indenters, Phil. Mag. 86, 5265

Ph. Kern, Ch. Jäggi, I. Utke, V. Friedli, J. Michler (2006) Local Electron Beam Induced Reduction and Crystallization of Amorphous Titania Films, Appl. Phys. Lett. 89, 21902 (2006)

B. Moser, J. Löffler, J. Michler (2006) Discrete deformation in amorphous metals: an in-situ SEM indentation study, Phil Mag. 86, 5715

I. Utke, V. Friedli, J. Michler, T. Bret, X. Multone, P. Hoffmann P (2006) Density determination of focused-electron-beam-induced deposits with simple cantilever-based method, Appl. Phys. Lett. 88, 31906

I. Utke, V. Friedli, S. Amorosi, J. Michler and P. Hoffmann (2006) Measurement and simulation of impinging precursor molecule distribution in focused particle beam deposition/etch systems,  Microelectron. Eng. 83, 1499

I. Utke, V. Friedli, S. Fahlbusch, S. Hoffmann, P. Hoffmann, J. Michler (2006) Tensile strengths of metal-containing joints fabricated by focused electron beam induced deposition, Adv. Eng Mater. 8, 155

T. Nelis, M. Aeberhard, M. Hohl (2006) Characterisation of a pulsed rf-glow discharge in view of its use in OES, J. Anal. Atom. Spectrom. 21, 112

I. Utke, V. Friedli, S.Amorosi, J. Michler, P. Hoffmann (2006) Measurement and simulation of impinging precursor molecule distribution in focused particle beam deposition/etch systems, Microelectron. Eng. 83, 1499

C. Jaeggi, P. Kern, J. Michler (2006) Film formation and characterization of anodic oxides on titanium for biomedical applications, Surf. Inter. Anal. 38, 182

M. Hohl, A. Kanzari, J. Michler, T. Nefis, K. Fuhrer, M. Gonin (2006) Pulsed r.f.-glow-discharge time-of-flight mass spectrometry for fast surface and interface analysis of conductive and non-conductive materials, Surf. Inter. Anal. 38, 292

P. Schwaller, M. Aeberhard, T. Nelis (2006) Rapid depth profiling of lead zirconate titanate (PZT) thin films by pulsed glow-discharge optical emission spectroscopy, Surf. Inter. Anal. 38, 757

P. Kern, Ch. Jäggi, J. Michler (2006) Electrolytic deposition of titania films as interference coatings on biomedical implants: microstructure, chemistry and nanomechanical properties, Thin Solid Films 494, 279-286

R. Gassilloud, J. Michler, C. Ballif, Ph. Gasser, P. Schmuki (2006) Selective Etching of n-InP(100) Trigerred at Surface Dislocations Induced by Nanoscratching, Electrochimica Acta 51, 2182

 M. Hadad, G. Blugan, J. Küblet, S. Rollier, J. Michler (2006) Tribological behaviour of Si3N4-TiN based multilayer laminates, Wear 260, 634

P. Schwaller, A. Fischer, R. Thapliyal, M. Aeberhard, J. Michler and H.J. Hug (2005)  Single-target DC-pulsed deposition of lead zirconate titanate thin films: Investigation of the chemical and mechanical properties by glow-discharge optical emission spectroscopy and nanoindentation, Surf. Coat. Tech., 200, 1566

R. Gassilloud, Ch. Ballif, Ph. Gasser, G. Buerki, J. Michler (2005) Deformation Mechanisms of  Silicon during Nanoscratching, phys. stat. sol. A 202, 2858

Ch. Jaeggi, P. Kern, T. Zehnder, H. Siegenthaler, J. Michler (2005) Anodic Thin Films on Titanium used as Masks for Surface- Micropatterning of Biomedical Devices, Surf Coat. Tech. 200,1913

P. Schwaller, F.-J. Haug, J. Patscheider, J. Michler (2005) Nanocomposite hard coatings: Deposition issues and validation of their mechanical properties, Adv. Eng. Mater. 7, 318-322

M. Hueppe, U. Schlierf, R. Gassiloud, J. Michler, P. Schmuki (2005) Electrochemical structuring of mechanically activated n-InP(100) surfaces, phys. stat. sol. (c) 2, 3359-3364

S. Bouillaguet, A. Schütt, P. Alander, P. Schwaller, G. Buerki, J. Michler, M. Cattani-Lorente, P. K. Vallittu, I. Krejci (2006) Hydrothermal and Mechanical Stresses Degrade Fiber matrix Interfacial Bond Strength in Dental Fiber-reinforced Composites, J.  Biomed. Mater. Res. B 76, 98

St. Fahlbusch, S. Mazerolle, J.-M. Breguet, A. Steinecker, J. Agnus, R. Pérez and J. Michler (2005) Nanomanipulation inside a scanning electron microscope, J. Mater. Proc. Tech. 167, 371-382

B. Moser, H. Meinhard, W. Muster, J. Michler (2005) Observation of instabilities in plastic deformation by in-situ SEM indentation experiments observation, Adv. Eng. Mater. 7 388-392,

I. Utke, J. Michler, P. Gasser, C. Santschi, D. Laub, M. Cantoni, P. Hoffmann (2005) Cross section investigation of compositions and substructures of tips obtained by focussed electron beam induced deposition, Adv. Eng. Mater. 7: 323-331

C. Ballif, K. Wasmer, R. Gassilloud, C. Pouvreau, R. Rabe, D. Schulz, J. Michler (2005) Cleavage fracture of brittle semiconductors from the nanometer to the centimeter scale, Adv. Eng. Mater. 7: 309-317

J. Michler, R. Rabe, J.-L. Bucaille, B. Moser, P. Schwaller and J.-M. Breguet (2005) Investigation of wear mechanisms through in-situ observation during nanoscratching inside the scanning electron microscope, Wear 259, 18-26

R. Rabe, J.-M. Breguet, P. Schwaller, S. Stauss, J. Patscheider, J. Michler (2004) Observation of Fracture and Plastic Deformation during Nanoindentation and Nanoscratching Inside the Scanning Electron Microscope, Thin Solid Films 469–470, 206–213

P. Schwaller, J. Patscheider, L. Kollo and J. Michler (2004) Microtribological studies of different nanocomposite TiC / a-C:H coatings using a modified nanoindentation setup, Trib. Lett. 17, 757-763

T. Nelis, M. Aeberhard, R. Payling, J. Michler, P. Chapon (2004) Relative calibration mode for Compostional Depth Profiling in GDOES, J. Anal. At. Spectrom. 19, 1354 - 1360

R. Payling, T. Nelis, M. Aeberhard, J. Michler, P. Seris (2004) A layer model approach to background correction in rf-GDOES, Surf  Interface. Anal. 36, 1384-1391

J.-L. Bucaille, S. Stauss , P. Schwaller , J. Michler (2004) A new technique to determine the elastoplastic properties of thin metallic films using sharp indenters, Thin Solid Films 447, 239-245

J. Michler, R. Gassilloud, Ph. Gasser, P. Schmuki (2004) Defect-free AFM-Scratching at the Si/SiO2-interface used for Selective Electrodeposition of Nanowires, Electrochem. Solid St. 7, A41-A43

J. Michler, M. Aeberhard, D. Velten, S. Winter ,R. Payling, J. Breme (2004) Depth profiling by GDOES: application of hydrogen and d.c. bias voltage corrections to the analysis of thin oxide films, Thin Solid Films 447, 278-283

J-L. Bucaille, A. Rossol, S. Stauss, B. Moser, and J. Michler (2004) Determination of the matrix in situ flow stress of a continuous fibre reinforced metal matrix composite using instrumented indentation, Mat. Sci. Eng. A 369, 82 - 89

R. Payling, O. Bonnot, E. Fretel, O. Rogerieux, M. Aeberhard, J. Michler, T. Nelis, U. Hansen, A. Hartmann, P. Belenguer, P. Guillot (2003) Modelling the RF Source in GDOES, J Anal. Atom. Spectrom. 18, 656–664

R. Payling, P Chapon, K Shimizu, R Passetemps, A Jadin, M Aeberhard, J Michler (2003)  Surfaces, thin films and coatings', in RK Marcus (Ed), "Glow Discharge Plasmas in Analytical Spectroscopy“, Chichester, John Wiley & Sons

R. Payling, M. Aeberhard, J. Michler, C. Authier, P. Chapon, T. Nelis, L. Pitchford (2003) Theory of Relative Sputtering Rates in GDOES, Surf. Interface Anal. 35 (4): 334-339

K. Thoma, L. Rohr, H. Rehmann, S. Roos, J. Michler (2003) Materials failure mechanisms of hybrid ball bearings with silicon balls, Tribol. Int. 37, 463-471.

S. Stauss, P. Schwaller, J.-L. Bucaille, E. Blank and J. Michler (2003) Determining the stress-strain behaviour of small devices by nanoindentation in combination with inverse methods, Microelectron Eng 67-8, 818-825

R. Payling, J. Michler, M. Aeberhard, Y. Popov (2003) New aspects of quantification in RF-GDOES, Surf. Interface Anal. 35,  583-589

J.L. Bucaille, S. Stauss , E. Felder , and J. Michler (2003) Determination of plastic properties of metals by instrumented indentation using different sharp indenters, Acta Mater. 51 (2003) 1663–1678

R. Payling, J. Michler, M. Aeberhard (2002) Quantitative analysis of conductive coatings by rf-GD-OES: hydrogen, dc bias voltage and density corrections, Surf. Interface Anal., 33, 472

R. Payling, P. Chapon, P. Belenguer, Ph. Guillot, L. Pitchford, L. Therese, J. Michler, M. Aeberhard (2002) Characterising the Radio Frequency Plasma Source for Glow Discharge Optical Emission Spectroscopy, ISIJ Transactions,  ISIJ International, Vol.42, 101

J. Michler, E. Blank E. (2001) Modelling of load bearing capacity and fracture of thin films: Diamond and DLC layers on steel substrates, Thin Solid Films, vol.381, no.1; 2 Jan. 2001; 119

F. Folio, J. Michler, G. Barbezat (2001) Influence of laser surface preparation on adhesion of thermally sprayed coatings, Surface Eng. 17, 490

M. Schreck, H. Roll, J. Michler, E. Blank, B. Stritzker (2000) Stress distribution in thin heteroepitaxial diamond films on Ir/SrTiO3 studied by X-ray diffraction, Raman spectroscopy, and finite element simulations, J. Appl. Phys. 88, 2456-66

Michler J., Mermoux M., Kaenel von Y., Haouni A., Lucazeau G., Blank E. (1999) Residual stress in diamond films : origins and modelling, Thin Solid Films 357 (2), 200

Michler J., Tobler M., Blank E. (1999) Thermal annealing behaviour of alloyed DLC films on steel: Determination and modelling of mechanical properties, Diamond Relat. Mater. 8, 510

Stiegler J., Bergmaier A., Michler J., Laufer S., Dollinger G., Blank E. (1999) The effect of nitrogen on low temperature growth of diamond films, Thin Solid Films 352 (1-2), 29

Stiegler J., Michler J., Blank E. (1999) An investigation of structural defects in diamond films grown at low substrate temperatures, Diamond Relat. Mater. 8, 651

Blank E., Michler J. (1998) Current issues in mechanics of layers systems for sensors and actuators, Adv. Solid State Phys. 38, 593

Stiegler J., Bergmaier A., Michler J., Kaenel von Y., Dollinger G., Blank E. (1998) Impurity and defect incorporation in diamond films deposited at low substrate temperatures, Diamond Relat. Mater. 7 (1998), 193

Michler J., Kaenel von Y., Stiegler J., Blank E. (1998) Complementary application of electron microscopy and micro-Raman spectroscopy for microstructure, stress, and bonding defect investigation of heteroepitaxial chemical vapor deposited diamond films, J. Appl. Phys. 83, 187

Stiegler J., Lang T. , Kaenel von Y., Michler J., Blank E. (1997) Activation energy for diamond growth from the carbon-hydrogen gas system at low substrate temperatures, Appl. Phys. Lett. 70, 173

Michler J., Stiegler J., Kaenel von Y., Moeckli P., Dorsch W., Blank E. (1997) Microstructure Evolution and Non-Diamond Carbon Incorporation in CVD Diamond thin Films grown at low Substrate Temperatures, J. Cryst. Growth 172, 404

Kaenel von Y., Stiegler J., Michler J., Blank E. (1997) Stress distribution in heteroepitaxial chemical vapor depositied diamond films, J. Appl. Phys. 81, 1726

Christriansen S., Albrecht A., Michler J., Strunk H.P. (1996) Elastic and Plastic relaxation in Slightly Undulated Misfitting Epitaxial Layers - A Quantitative Approach by Three-dimensional Finite Element Calculations, phys. stat. sol. (a) 156, 129

Albrecht M., Christiansen S., Michler J., Strunk H.P., Hansson P.O. Bauser E. (1996) Locally varying chemical potential and growth surface profile: a case study on solution grown Si(Ge)/Si, J. Cryst. Growth 167, 24

Albrecht M., Christiansen S., Michler J., Dorsch W., Strunk-H.P., Hansson P.O., Bauser E. (1995) Surface ripples, crosshatch pattern, and dislocation formation: cooperating mechanisms in lattice mismatch relaxation, Appl. Phys. Lett. 67,1232

C. Clévy, A. Hubert, S. Fahlbusch; N. Chaillet, J. Michler, (2006) Design, Fabrication and Characterization of a Flexible System Based on Thermal Glue for in Air and in SEM Microassembly, Bad Hofgastein, Third International Precision Assembly Seminar  (IPAS'2006), 21-31

S. Radicea, P. Kern, J. Michler, M. Textor (2006) Bioactive Coatings for Implants by Electrophoretic Deposition, European Cells and Materials Vol. 10. Suppl. 5, 2005, page STE8, ISSN 1473-2262

M. Hadad, G. Marot, Ph. Démarécaux, J. Lesage, J. Michler, S. Siegmann, Adhesion tests for thermal spray coatings: Application range of tensile, shear and interfacial indentation methods, Proceedings of the International Conference of Thermal Spray Coatings, Basel, 2005

J.-M. Solletti , M. Parlinska-Wojtan, J. Tharian, K. Wasmer, J. Michler, C. Ballif, D. Schulz, and A. Karimi, Fracture Mechanisms of GaAs Under Nanoscratching, MRS Proc. Vol.841, R9.15

M. Hadad, G. Marot, D. Chicot, J. Lesage, J. Michler, S. Siegmann, Adhesion tests for thermal spray coatings: A correlation of bond strength and interfacial indentation, accepted (2005), Surface Modification Technologies, in press

A.Schütt, G. Bürki, P. Schwaller, J. Michler, M. Cattani-Lorente, P. Vallitu, S. Bouillaguet (2004) Mechanical Properties of Fibre-Reinforced Dental Composites Subjected to Hydrothermal and Mechanical Ageing, European Cells and Materials Vol. 7. Suppl. 2, 55-56

S. Mazerolle, R. Rabe, S. Fahlbusch, J. Michler, J.-M. Breguet, "High Precision Robotics System for Scanning Electron Microscopes." , Microfactory, 4th International Workshop on Microfactories, October 15-17, 2004, Shanghai, China.

C. Ballif, K. Wasmer, R. Gassilloud, R. Rabe, C. Pouvreau, J.-M. Breguet, J.-M. Solletti, A. Karimi, D. Schulz, J. Michler (2004) Aspects of cleavage fracture of brittle semiconductor from the nanometer to the centimeter scale, Nanofair 2004, St. Gallen Switzerland

J.-L. Bucaille, S. Stauss and J. Michler (2003) Determination of the stress-strain curves of metals using instrumented indentation with sharp indenters: Validation on polycrystalline copper, The 9th International Conference on the Mechanical Behaviour of Materials, Geneva

J. Zenke, A. Sill, S. Fatikow, J. Michler, J. Brock and S. Büttgenbach (2003) Mechanical Materials Characterisation in a SEM, 2nd VDE World Microtechnologies Congress, Munich, 595-600

J. Zenke, A. Sill, S. Fatikow, J. Michler, S. Büttgenbach: "Mechanical materials characterisation in a SEM", Proc of 2nd VDE World Microtechnologies Congress (MICRO.tec 2003), Munich, Germany, 13-15 October, 2003, 595-600

J.L. Bucaille, S. Stauss, J. Michler, “Détermination de la contrainte d’ écoulement des métaux par indentation instrumentée: application au cuivre polycrystalline, 16ieme Congrès Francais de Mécanique Nice, 1-5 septembre 2003

F. Folio, J. Michler, G. Barbezat, E. Blank (2000) Measurement of the adhesion of ceramic coatings on TiAl6V4 substrates by Rockwell indentation, Proceedings of the 5th European Adhesion Conference, EURADH'2000

F. Folio, J. Michler, G. Barbezat, E. Blank (2000) Evaluation of the adherence of protal coatings by Rockwell indentations, E-MRS – IUMRS – ICEM 2000

Condo A.M., Leifer K., Rudra A., Michler J., Blank E., Kapon E. (1999) Contrast analysis in TEM images of InGaAs strained layers grown on non-planar substrates, in: Microscopy of semiconducting materials 1999, Inst. Phys. Conf. Ser 164,185

Leifer K., Rudra A. Biasol G., Michler J., Blank E. Buffat P.A. Kapon E. (1999) PEELS Imaging and Linescan Study of Concentration Anisotropies in AlxGa1-xAs and InyGa1-yAs Heterostructures Grown on Non-Plana Substrates, in: Microscopy of semiconducting materials 1999, Inst. Phys. Conf. Ser. 164, 27

Albrecht M., Christiansen S., Hansson P.O., Michler J., Strunk H.P. Bauser E. (1995) Surface ripples, crosshatch pattern, dislocation formation: interplay of elastic and plastic strain relaxation mechanisms, Inst. Phys. Conf. Ser. 146, 177