| Electron Microscopy Center |
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The Electron Microscopy Center at Empa Dübendorf offers electron microscopy services to internal and external R&D partners. The Center conducts forefront research in the development and application of new electron microscopy techniques in materials science and acts as a consulting unit for electron microscopy in materials science. The staff of the center carries out research tasks on-demand, offers training and provides hands-on support for practical applications.
The center operates transmission electron microscopes, scanning electron microscopes and facilities for specimen preparation. The instrumentation is employed for convention electron optical imaging (TEM & SEM), environmental and low-voltage SEM imaging, diffraction, atomic-resolution imaging by HRTEM and STEM (Z-contrast imaging), and for analytics covering EDX spectroscopy (TEM & SEM), electron energy-loss spectroscopy (EELS) and energy-filtered imaging.
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| Microscopes and Facilities |
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| JEOL 2200FS TEM/STEM |
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|  | High-resolution and analytical STEM/TEM
Electron source: Schottky field emission Omega filter for energy-filtered imaging (EFI) and EELS EDX (beryllium holder) Tomography Point resolution TEM 0.23 nm Resolution STEM 0.16 nm Operated at 200 kV, 120 and 80 kV Remotely operated Installation: 2009
Room: LA030.1 |
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| Philips CM30 TEM |
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Electron source: LaB6 thermionic emission Operated at 300 kV Point resolution TEM: 0.20 nm Installation: 2001
Room: LA048 |
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| FEI NovaNanoSEM 230 |
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|  | Low vacuum, low voltage SEM
Electron source: Schottky field emission High resolution imaging (< 2 nm @ 1 kV) Low voltage imaging, <200 V EDX, Oxford X-Max, fast mapping STEM detector (<1 nm at 30 kV) Detectors: TLD-SE, TLD-BSE, ET-SED, low-vacuum SED, GAD, UHR low-vacuum SED (Helix detector), STEM Installation: 2009
Room: LA030
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FEI ESEM XL30
Environmental SEM
Electron source: Schottky field emission Heating stage EDX Detectors: High vacuum ET-SED, BSED, GAD, large field detector, gaseous SED (GSED), GBSD, STEM Installation: 1999
Room: LA030 |
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Specimen preparation
Ion mill; Bal-Tec RES 101 Plasma cleaner Fischione 1020 Dimple grinder Tripod Tools for mechanical polishing and cutting
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- Dr. Rolf Erni, Head
Tel. +41 58 765 40 80, rolf.erni@empa.ch
- Dr. Yadira Arroyo, Senior application specialist SEM and TEM
Tel. +41 58 765 41 01, yadira.arroyo@empa.ch
- Dr. Marta D. Rossell, Senior application specialist SEM and TEM
Tel. +41 58 764 49 02, marta.rossell@empa.ch
- Daniel Schreier, Electronic technician, application specialist for SEM and TEM
Tel. +41 58 765 45 54, daniel.schreier@empa.ch
- Gabriele Ilari, PhD student
Tel. +41 58 765 41 56, gabriele.ilari@empa.ch
- Debora Keller, PhD student
Tel. +41 58 765 41 58, debora.keller@empa.ch
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Electron Microscopy Center Empa Ueberlandstr. 129 CH-8600 Dübendorf Switzerland Email: emc@empa.ch
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Flyer Electron Microscopy Center (PDF-File, Size, 6.2 MB)
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Electron microscopes operated by other Empa laboratories
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An Introduction by Rolf Erni (Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland)
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