Equipment Mechanics of Materials and Nanostructures
Microanalysis/Chemical Analysis
- Glow Discharge Optical Emission Spectrometer (GD-OES), JY RF-5000
- X-Ray Diffractometer 2theta/theta, Bruker D8 Discover (Bragg Brentano and parallel beam setup, copper tube, Eulerian cradle)
For Phase Identification, Grain Size, Grazing Incidence, X-Ray Reflectometry, Stress, Texture - X-Ray Fluorescence Spectrometer Fischerscope X-Ray XDV-SDD
- Confocal Raman spectroscopy (NTEGRA Spectra from NT-MDT), Raman Mapping, Lasers: He-Ne (633 nm) and solid state (532 nm), Objectives : 10x, 50x, 100x, 250x, Spectral Resolution: <0.5 cm-1
- Balance Mettler PM 2500 MultiRange with addition for densities
- High spatial resolution gallium ion secondary ion mass spectrometer, integrated with Tescan Lyra focused ion beam instrument - see below
- Contact and non-contact AFM, Phase Imaging, EFM/KFM, AFM and KFM Lithography, XYZ-scanning by sample (closed-loop)
- Coupling AFM/Raman, XY-scanning by excitation laser beam (closed-loop)/Piezo-driven mirror for scanning the apex of the tip with the incident beam
- Leica EMTIC3x Ionslicer
- Leica EMCPD300 Critical Point Dryer
- Leica EMACE600 Sputtlecoater (Gold, Carbon)
- Leica EMTXP sample preparation
Transmission Electron Microscopy
FEI Titan Themis 200 (ThermoFisher)
- X-FEG high brightness electron source
- Cs DCOR Probe Corrector 200 kV
- STEM imaging: High Angle Annular Dark Field detector (HAADF) with OptiSTEM software
- Super-X EDX System
- Ceta 16M Camera 200 kV with speed enhancement (4k x 4k STEM imaging with 40 fps; 512x512 with 320 fps)
- CompuStage Single-tilt Holder; High-visibility Low-background Double-tilt Holder
- Velox Analytical and Imaging softwares
Electron Microscopy/ FIB
High resolution cold field emission SEM Hitachi S-4800 (CFE)
- STEM detector zu S-4800
- EDX system EDAX Genesis 4000
- EBSD DigiView II camera. EDAX OIM software (V5.3.1)
- Hysitron Picoindenter
Large Chamber, variable pressure SEM Hitachi S-3600VP
- • XENOS e-beam lithography software
• external and internal gas injection system for direct patterning
• high temperature stage
• stage current monitoring
• SEM compatible femtogram mass sensor
Large Chamber SEM, SEM Zeiss DSM96
- Micro tensile stage for SEM and light microscope
- Micro bending stage for SEM and light microscope, Kammrath und Weiss
- home-made Microindenter
- Heating stage
Tescan Lyra/XMU Dual beam FIB
- YAG SE detector
- Retractable annular scintillator type BSE (YAG Crystal)
- Fully motorized stage
- Variable pressure mode for SEM
- 4-d Nanomanipulator using slip-stick piezos from SmarAct
- Gas injection system using slip-stick piezos from SmarAct
- Time-of-Flight Mass Spectrometry (TOFMS)
Tescan Lyra3/XMU FEG/FIB
- YAG SE detector
- Retractable annular scintillator type BSE (YAG Crystal)
- Retractable CL Detector Panchromatic cathodoluminescence detector 185 nm – 850 nm
- Fully motorized stage
- Variable pressure mode for SEM
- STEM Detector Transmitted electrons detector; Bright Field and Dark Field imaging
- EBIC Electron beam induced current detection
- Time-of-Flight Mass Spectrometry (TOFMS)
- EBSD DigiView 5 camera. EDAX OIM software
- EDS Octane Plus Silicon Detector (SDD). EDAX TEAM software
- WDS TEXS HP from EDAX
- XRF IFG iMOXS-SEM with polycapillary mini-lens (Rh source)
- Tuning fork AFM dedicated for measurements in vacuum (In-house build, in collaboration with Specs)
Philips XL30-FEG ESEM
- Div detectors
Hitachi 3030Plus TableTop Electronmicroscope
Materials Mechanics and Nanomechanics
- CSM Nanointenter (Vacuum high temperature)
- MTS Nanoindenter XP (Indentation & Scratch & Mikrokompression)
- CSEM Nanohardness & Nanoscratch Tester (Indentation & Scratch)
- Micro tensile stage for SEM and light microscope, Kammrath und Weiss
- Micro bending stage for SEM and light microscope, Kammrath und Weiss
- home-made SEM Microindenter for SEM and light microscope
- Hardness test instruments: Universal Hardness Zwick HU2,5, Vickers, Brinell
Electrochemistry
- Autolab analytical potentiostats (including ac impedance module) and current booster (up to 20A)
- Computer controlled 6 kW power source
- Variety of electrochemical cells and reference electrodes
- Rotating propeller MEMS plating cell and Hull cell
- PH meter
- Conductivity meter
- Titration devices
- CVS devices
- Comsol FEM module plating/anodization
- One glove box
- Rapid Thermal annealing system
PVD
PVD chamber #1 (Mantis QPREP 500)
ALD-PVD multilayer adhesion studies without breaking the vacuum
Deposition techniques
- Three inch magnetrons for sputtering with RF and DC power sources
- E-beam assisted thermal evaporator with four independent pockets
- Shutter system for gradient depositions or patches
Loadlock features
- Chamber-in-chamber design with exhaust for ALD/CVD processes
- Dual heaters up to 250o C
- Six precursor lines, currently configured for Al2O3 and ZnO
Main chamber features
- Quartz crystal balance
- Substrate stage heating to 800o C
- Automated loadlock and sample transfer for multilayers
- Secondary MFC for reactive sputtering
PVD chamber #2 (Mantis M 600)
Studying the effect of nanoparticles and pulsed DC plasma
NanoGen 50 Nanoparticle source
- MesoQ quadrupole mass spectrometer for mass filtering and size control
One 2 inch and one 3 inch magnetron
- 2x HiPIMS sputter sources, plus RF and DC
- Adjustable magnetron distance for very high deposition rates
- Custom magnet sets for plasma density control
Main chamber features
- UHV design for plasma science
- Viewports for optical inspection of plasma in transmission and reflection
- Crygogenically cooled panels for extreme low base pressure
- Substrate stage heating to 800o C
- Loadlock for manual sample transfer
- Secondary MFC for reactive sputtering
PVD chamber #3 (Polygnon Physics)
- Novel mini ECR plasma sputter source
- Up to 24 sources in simultaneous operation
- Reactive sputtering possible
EMPA Cleanroom in Thun
Specifications
- Class 10.000 or ISO 7
- 35 m2 clean space and 10 m2 grey zone
- Yellow light filtration for photosensitive materials
- All exposure equipment interoperable at 365 nm (I-line)
Equipment
- Nanoscribe Photonic Professional GT
Two-photon 3D lithography with resolution down 100 nm - Karl Süss MA-6
4 inch contact aligner with 1 um resolution - IMP SF-100
Fast prototyping maskless dot matrix printer with 15 um resolution - Full LiGA mold and 2D/3D photoresist processing line
Various spincoaters and baking stations
ALD
- The Mantis PVD chamber load lock was modified to contain an ALD chamber with 6 gas inlets to coat PVD nanoparticles and thin PVD layers without breaking the vacuum.
- ALD load lock: 6 inch wafer, Materials: Oxide coatings, like Al2O3, ZnO, TiO2.
- PVD: High vacuum chamber with a nanoparticle gun, e-beam evaporation and DC & RF magnetron sputtering. Materials: metals, nitrides, oxides, multilayers, combinatorial
Custom made stationary ALD reactor
-
3 gas inlet lines. Temperatures up to 240°C. Al2O3, ZnO, TiO2, SiO2, CeO2, etc.
-
Modifiable to use O3 and O2 plasma
-
4 inch wafer size, 3 cm thick samples
-
Full control over temperature and variable cycle/purge/exposure periods as function of total cycle number
-
Integrated novel Temperature Step ALD [C. Guerra, H.G. Park, I. Utke et al., Nanoscale (2015) DOI: 10.1039/c5nr02106e]
Mobile ALD
- Autonomous and can be transported to any location as it is installed on a rack. It has a 3+ valve manifold line to connect to any reactor or characterization equipment for in-situ ALD measurements.
-
Reactors used so far: Flow through reactor for fast ALD on porous membranes and powders.
-
Mini reactor for in-situ Raman studies of initial ALD stage
Arradiance Benchtop ALD
- This commercial system is designed in a compact way to allow for precursors with low vapour pressures to enable off-standard oxide, metal, and fluoride film materials. It is suitable for 6 inch wafers and heats to 300°C
-
Equipped with a QCM it allows for in-situ control of initial growth during ALD as well as growth monitoring
-
It also features a glove box connection for ALD on moisture and air sensitive samples