We are interested in outstanding and highly motivated candidates who would like to work in an inspiring environment at the frontiers of materials characterization by advanced electron microscopy methods.
The aim of this project is to understand the microscopic mechanisms of nucleation and domain wall motion by probing ferroelectric domain dynamics at atomic resolution. For this purpose in-situ heating/electrical biasing transmission electron microscopy investigations will be carried out in combination with advanced transmission electron microscopy techniques (e.g. aberration-corrected STEM, STEM-DPC, electron holography, EELS and EDX). A substantial part of this position involves the development and/or implementation of new image analysis methods.
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